MetaStable Instruments awarded patent on optical thin-film metrology OptoIQ St. Peters, MO--Optical components and coatings maker MetaStable Instruments has received US Patent #8139234, covering a technique for measuring <1 ppm absorption in certain thin-film optical coatings as they are being deposited in a vacuum chamber. |
Wednesday, April 25, 2012
MetaStable Instruments awarded patent on optical thin-film metrology - OptoIQ
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